INTERFACE BOARD

PROBE CARD INTERFACE BOARD TEST SOCKET OLED/LED TEST SYSTEM MEMS Product

PRODUCTS INTERFACE BOARD OLED Test

OLED Test

OLED Test LED Test

ICP / OCP Pattern Generator Pattern Generator Online Inquiry

Feature

Self-diagnosis functions

Open/short test function

Pin to pin short test function

Common or Individual Type Possible

Pattern generator with 20 or More channels simultaneously lit on Glass.
Electrical Cell Test System Array Tester Online Inquiry

Feature

Electrical Test System

MAX 10,000CH. More

7T1C inspection Function

High-speed interface Tester

Array tester is an inspection equipment that detects and verifies defects through electrical inspection of the TFT array state.
Touch Panel Open/Short Test System TOS System Online Inquiry

Feature

Open / short detection

Aging function

IR detection for Short defects

Improve the yield and stabilize the process

Dual Contact Probe Unit System

TOS System is a device that can find Touch Sensor Panel open and short defects through electrical test.

TOS3000

Single Contact Probe with IR function

TOS4000

Dual Contact Probe without IR function
Electrical Array Test System ATS Online Inquiry

Feature

6G/8G Glass Handling System

AMOLED Cell Circuit Test (7T1C and more)

High-Speed Interface

Implement Fine Align Using Pad Align

A complete set of equipment with Prober and Tester

Array Test System is a device that inspect the AMOLED pixel circuit is normal or not.
Full Contact Array Test System With Auto Probe Unit FCA System Online Inquiry

Feature

8G OLED / LCD Glass Full Contact Test. (Hybrid Glass)

31”~98” Glass Handling Possible

High-Speed Interface

Higher efficiency for Failure Analysis

Auto Probe Change Unit Function

FCA System is a facility for mass production testing of large OLED Products. It is possible to operate the 8G OLED / LCD glass and supports hybrid glass test.