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LC Component

High Quality LC Component Online Inquiry

development history

2015. 05.

TL4C2-101 (PCIE Gen3)
2016. 11.

TL4C2-301 (PCIE Gen3)
2017. 03.

TL4C2-40x (PCIE Gen4)
2018. 11.

TL4C2-50x (PCIE Gen5)
2020. 05.

TL4C2-60x (PCIE Gen6)

Technology

MEMS Inductor/Relay Design and Fab. Technology

High reliability performance with Ni plating & wafer to wafer bonding technology.

Various inductor solution application.

Small Size PKG using MEMS Miniaturization Technology

Loopback Component with the smallest size in existence

~75% Size compared to Mechanical RF relay

Increased parallelism by minimizing PCB mounting area

No mechanical lifetime issue

PKG Design Technology Based on SI Simulation & Measurement

Loopback Bandwidth > 40GHz

Application@ATE : PCIE Gen6 & Up to 70Gbps High Speed I/O’s & up to 128Gbps PAM4

lc component

Find out right solution for your application!

Inductor Path

Loopback Path

Loopback test for PCIE Gen3 / USB3.1 / 10Gbps Ethernet @ATE

Part Number	Data Sheet	Description	Buy/Contact
TL4C2-101		2CH(DIFF) AC Coupled Loopback
TL4C2-301
TL4C2-302
TL4-000		2CH(DIFF) DC Coupled Loopback
TL4-001
TL4-300
TL4-301

Loopback test for PCIE Gen4 / 20Gbps Ethernet / Thunderbolt3@ATE

Part Number	Data Sheet	Description	Buy
TL4C2-401		2CH(DIFF) AC Coupled Loopback
TL4C2-402		2CH(DIFF) AC Coupled Loopback
TL4C2-403		2CH(DIFF 85ohm) AC Coupled Loopback
TL4C2-404		2CH(DIFF 85ohm) AC Coupled Loopback

Loopback test for PCIE Gen5(32Gbps) & up to 112Gbps PAM4@ATE

Part Number	Data Sheet	Description	Buy
TL4C2-501		2CH(DIFF 100ohm) AC Coupled Loopback
TL4C2-502		2CH(DIFF 100ohm) AC Coupled Loopback
TL4C2-503		2CH(DIFF 85ohm) AC Coupled Loopback
TL4C2-504		2CH(DIFF 85ohm) AC Coupled Loopback
TL4-500		2CH(DIFF) DC Coupled Loopback

Loopback test for PCIE Gen5(32Gbps) & up to 50Gbps High Speed I/O

Part Number	Data Sheet	Description	Buy
TL4C2-501D		DC + LF Test <10MHz(only)
TL4C2-502D
TL4C2-503D
TL4C2-504D

Loopback test for PCIE Gen6(64Gbps) & up to 128Gbps PAM4@ATE

Part Number	Data Sheet	Description	Buy
TL4C2-601		2CH(DIFF 100ohm) AC Coupled Loopback
TL4C2-602		2CH(DIFF 100ohm) AC Coupled Loopback
TL4C2-603		2CH(DIFF 85ohm) AC Coupled Loopback
TL4C2-604		2CH(DIFF 85ohm) AC Coupled Loopback
TL4-600		2CH(DIFF) DC Coupled Loopback
TL2-600		1CH(DIFF) DC Coupled Loopback

Loopback test for PCIE Gen6(64Gbps) & up to 128Gbps PAM4@ATE

Part Number	Data Sheet	Description	Buy
TL4C2-601D		DC + LF Test <10MHz
TL4C2-602D

Display port & MIPI CSI-1,2,3 Termination

Part Number	Data Sheet	Description	Buy
TL4R4C4-100		Display port & MIPI-CSI(transmitter only interface) 4CH Termination

SGRF303 Replace Package (Can use SGRF303 Relay Footprint)

Part Number	Data Sheet	Description	Buy
TL-300R-A/B		A : Normally Open Type B : Normally Closed Type
TL-400R-A/B		A : Normally Open Type B : Normally Closed Type

Validation test for High Speed I/O

Part Number	Data Sheet	Description	Buy
TA-05		High Speed I/O Rx Equalizer Stress Component
TA-10
TA-15
TA-20

History of Loopback Circuit in ATE

An LC Component is used for the Loopback test of High speed I/O ports such as USB, ThunderBolt, PCI, SATA , etc.

In order to test a High-Speed I/O port, ATE s with a high speed channel of several GHz or greater are required. Significant investment of these high speed ATEs are required for mass-production testing. To reduce test costs, most semiconductor manufacturers use a loopback test circuit concept shown below to test high-speed I/O ports.

High-speed mechanical relays typically used in the loopback test, are expensive, space constrained, and short-lived. To overcome this, TSE developed a very compact loopback component by utilizing MEMS technology.