LCT Solution (Low Cost Tester Solution)

TDMS-100 (TSE DC Measure System)

Since TDMS-1000 is a tester specialized in manufacturing and assembling characteristics inspection of semiconductor package, wafer, PCB board, etc., it can measure open, short, leakage, RLC and Daisy-chain. The TDMS-1000 supports easy programming using its GUI and provides TDAT (TSE DC Analysis Tool) for efficient mass production management.

Feature

  • 256~3072 channel configuration
  • Other channel state setting
  • LC measurement with option slot
  • GUI based programming
  • Analysis tool (STDF support)
  • Ball map, wafer map display
  • Customized special function support

Specifications

Total channels 256 ~ 3072CHs
No of PMU 4CHs(up to 16)
function VSIM, ISVM FMV, RES
Accuracy ±1%
DC ±5V, 40mA
Current range ±5uA ~ 40mA
Test time 1ms / CH
Pin setting VT1, VT2, GND, OPEN, PMU

TDMS- 2000 (TSE DC Measure System)

The TDMS-2000, a new model of the TDMS-1000, provides Multi PMU and increased test channels. It can support various types of user power. That is, components or relays can be operated, and it can provide high mass production efficiency since two handlers can be applied to one system.

Feature

  • 256~4096 Channel Configuration
  • 64PMU Channels
  • User DC Power Supplier (1.8V/3.3V/5V/12V/±15V)
  • Low Resistor Measure (4 wire Kelvin Measure)
  • Dual Handler Docking
  • Multi Option Slot

Specifications

Total channels 256~4096channels
No of PMU 64CHs
function VSIM, ISVM, FMV, RES
Accuracy ±0.5%
DC ±10V, 80mA
Current range ±5uA ~ 80mA
Test time 0.3ms/CH
Pin setting VT1, VT2, GND, OPEN, PMU
Function GPIO, Relay control

TDAS-3072 (TSE DC Analysis System)

TDAS-3072, which is optimized for DC analysis of semiconductors, is manufactured with KELVIN structure to realize high accuracy. It is possible to test Open, Short, Leakage, etc. It is also possible to analyze DC characteristics through its I/V curve function. It supports easy programming by using an Excel file, and it can be operated easily by applying its intuitive GUI.

Feature

  • 3072 Channel
  • O/S, Leakage Test Mode
  • Kelvin test structure
  • I/V curve test mode
  • User friendly GUI
  • Easy test PGM setup with Excel
  • Ball map display (Pass/Fail)
  • ±10V (1A) Output
  • VCC Supplier

Specifications

Total channels 3072CHs
No of PMU 1CH
No of VCC 1CH
Voltage ±10V (Resolution 1mV)
Accuracy ±0.5%
Range ±5uA ~ 1A
Resolution 1mA

UAP- 100 (Universal Auto Probe Station)

UAP-100 is a device to analyze I-V curve characteristics by automatically probing a Fine Pitch Package or a Micro Bump. It prevents scratches on the package ball or on the bump, and it supports precise probing to provide you with convenience for analyzing DC characteristics.

Feature

  • Full Auto Probe Solution
  • 2Point Prober
  • Auto 3axis Moving (X, Y, Z)
  • Precise probing
  • I-V Curve Kelvin Measure
  • User Format Report
  • Ball Map Display
  • Auto Force Detect

Specifications

Size 1600(L)X1080(W)X1610(H)
Weight 400Kg
Input Power AC1-Phase 220V/60Hz/3KW
Auto Probing Minimum 25um
Package size 5x5mm ~ 60X60mm
Measure I-V curve
Range ±5uA ~ 1A
Resolution 1mA

TT-E400e

TT-E400e has been developed as a multi-channel, multi-currency structure as a tester targeting eMMC products. It is possible to perform concurrent testing of MCP products. It is also possible to test NAND flash memories. It has been developed as a low-cost type to reduce the burden on the customer and to support excellent scalability.

Feature

  • Easy programming
  • Source sync
  • Match function
  • Quick setup & operation
  • Low Price
  • Shmoo tool

Specifications

Channels 416 ~ 6656 CHs
PPS 48 ~ 768EA (1~5V, 1A)
Parallelism 16 ~ 256 DUTs
Dara rate 400Mbps (eMMC V.5.0)
DC ±8V, ±40mA
Options GPIO, CPS, CW, PBID, PBTYPE
ALPG Full address operation Data TP

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