LCT Solution (Low Cost Tester Solution)

TDMS-100 (TSE DC Measure System)

TDMS-1000是专门进行半导体package、wafer、PCB board等制造及装配特性检测的测试仪,可测定 open、short、leakage、RLC、Daisy-chain等。TDMS-1000利用GUI可以简单地 programming ,为实现有效的量产管理,提供分析程序 TDAT(TSE DC Analysis Tool)。

Feature

  • 256~3072 channel configuration
  • Other channel state setting
  • LC measurement with option slot
  • GUI based programming
  • Analysis tool (STDF support)
  • Ball map, wafer map display
  • Customized special function support

Specifications

Total channels 256 ~ 3072CHs
No of PMU 4CHs(up to 16)
function VSIM, ISVM FMV, RES
Accuracy ±1%
DC ±5V, 40mA
Current range ±5uA ~ 40mA
Test time 1ms / CH
Pin setting VT1, VT2, GND, OPEN, PMU

TDMS- 2000 (TSE DC Measure System)

TDMS-2000是TDMS-1000的后续型号,提供 Multi PMU 和增加的test channel。通过提供各种 User Power,可以运行 Component 或relay等,在一个系统上适用两台handler,提高量产效率性。

Feature

  • 256~4096 Channel Configuration
  • 64PMU Channels
  • User DC Power Supplier (1.8V/3.3V/5V/12V/±15V)
  • Low Resistor Measure (4 wire Kelvin Measure)
  • Dual Handler Docking
  • Multi Option Slot

Specifications

Total channels 256~4096channels
No of PMU 64CHs
function VSIM, ISVM, FMV, RES
Accuracy ±0.5%
DC ±10V, 80mA
Current range ±5uA ~ 80mA
Test time 0.3ms/CH
Pin setting VT1, VT2, GND, OPEN, PMU
Function GPIO, Relay control

TDAS-3072 (TSE DC Analysis System)

针对半导体DC分析而优化的TDAS-3072设备采用KELVIN structure制造,可实现高精度。可测试开路、短路、漏电等,并可通过I/V曲线功能分析直流特性。可以使用Excel文件简单编程,并且可以通过直观的GUI轻松操作。

Feature

  • 3072 Channel
  • O/S, Leakage Test Mode
  • Kelvin test structure
  • I/V curve test mode
  • User friendly GUI
  • Easy test PGM setup with Excel
  • Ball map display (Pass/Fail)
  • ±10V (1A) Output
  • VCC Supplier

Specifications

Total channels 3072CHs
No of PMU 1CH
No of VCC 1CH
Voltage ±10V (Resolution 1mV)
Accuracy ±0.5%
Range ±5uA ~ 1A
Resolution 1mA

UAP- 100 (Universal Auto Probe Station)

通过自动探测 Fine Pitch Package 或Micro Bump来分析 I-V curve 特性的装置,可以防止package ball 或 Bump上的划伤,并提供精确的探测,为分析DC 特性提供便利性。

Feature

  • Full Auto Probe Solution
  • 2Point Prober
  • Auto 3axis Moving (X, Y, Z)
  • Precise probing
  • I-V Curve Kelvin Measure
  • User Format Report
  • Ball Map Display
  • Auto Force Detect

Specifications

Size 1600(L)X1080(W)X1610(H)
Weight 400Kg
Input Power AC1-Phase 220V/60Hz/3KW
Auto Probing Minimum 25um
Package size 5x5mm ~ 60X60mm
Measure I-V curve
Range ±5uA ~ 1A
Resolution 1mA

TT-E400e

作为针对eMMC产品的测试仪而被开发成 Multi channel、Multi para 结构。可进行MCP产品的concurrent test,还可以进行NAND flash等的测试。作为低成本型开发,减轻客户的负担,具备出色的可扩展性。

Feature

  • Easy programming
  • Source sync
  • Match function
  • Quick setup & operation
  • Low Price
  • Shmoo tool

Specifications

Channels 416 ~ 6656 CHs
PPS 48 ~ 768EA (1~5V, 1A)
Parallelism 16 ~ 256 DUTs
Dara rate 400Mbps (eMMC V.5.0)
DC ±8V, ±40mA
Options GPIO, CPS, CW, PBID, PBTYPE
ALPG Full address operation Data TP

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