Tester On-Board Interface

BOST Interface Solution

BOST is an optimal solution to suppress the rise of COT caused by increasing the speed and density of memory semiconductors. It will maximize productivity because it contributes to parallel expansion by testing the latest devices using old equipment without adding new facilities.

Feature

  • Supply customized test solution
  • Speed X2 ~ X8
  • Parallel expansion
  • Command code interface
  • LUT pattern
  • Source sync & clock sync schem
  • Variable mode register setting
  • Multi firmware configuration

BOST Solution Development Experience

Target Tester Speed Benefit Application
LPDDR2 T5581 / 85 800Mbps Speed up X2
Para ext x4
AC, DC, IDD
LPDDR2 Magnum 2X 1066Mbps Speed up X2
Para ext x4
AC, DC, IDD
DDR3 T5581 / 85 1Gbps Speed up X2
Para ext x4
AC, DC, IDD
DDR3 T5581 / 85 1600Mbps(DDR)
2133Mbps(SDR)
Speed up x4~x8
Para ext x4
AC, DC, IDD
DDR4 T5581 / 85 1600Mbps(DDR)
2400Mbps(SDR)
Speed up x4~x8
Para ext x4
AC, DC, IDD
eMCP
(LPDDR2 + eMMC)
Magnum 2X 1066Mbps Speed up X2
Para ext x4 &
Concurrent
AC, DC, IDD

CFDS Interface Solution

Given the existing Low Speed Testers, the test environment requires a new high-speed tester as the CLK speed of memories(e.g. DDR3, DDR4, LPDDR3, LPDDR4, GDDR5, GDDR6) increases.

TSE’s CFDS interface solution utilizes existing a Low-Frequency Tester to realize High-Frequency Clock so that it can test a high-speed clock sync memory at a low cost without investing in a new tester.

Feature

  • ATE Application : T5581, T5585, T5588, T5593, T5503, Ultra Memory, Magnum
  • Target Device : DDR3, DDR4, LPDDR3, LPDDR4, GDDR5, GDDR6
  • Single Ended Input, Differential Output

Power Boost Interface Solution

Thicker, thinner and more powerful devices are preferred for easy portability as the center of gravity moves from PC to smartphone.

Low-power DDR products are being developed as a way to reduce power consumption as memories evolve, and a low-power compensation Power Boost Interface Solution is being provided for testing low-power memory products.

Feture

Test Device DDR3, DDR4, LPDDR3, LPDDR4, GDDR5
Input Voltage +2.5~5.5V
Output Voltage +0.75~3.3V
Output Current 2A
Tracking Voltage +0.75~3.3V
Accuracy ±5mV

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